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Contact usPAPER DOI: 10.1109/IRPS48228.2024.10529458
poster
Microscopic modeling of MgO barrier degradation due to interface oxygen Frenkel defects in scaled MTJ toward high-density STT-MRAM
We investigate the mechanism of time-dependent degradation of MgO barrier and propose a way to suppress it. Resistance drift and degradation in tunnel magnetoresistance ratio under an operating voltage were experimentally observed in scaled MTJs. With microscopic calculations, we find that the degradation can be explained by current-induced generation of oxygen Frenkel defects at the interface of MgO and Fe. We reveal that the reduction of initial oxygen vacancies in MgO can suppress the degradation.