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VIDEO DOI: https://doi.org/10.48448/z38v-nx05
PAPER DOI: 10.1109/IRPS48228.2024.10529302

poster

IRPS 2024 Main Conference

April 17, 2024

Dallas, United States

Improved endurance reliability of ferroelectric hafnium oxide-based BEoL integrated MFM capacitors

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Microscopic modeling of MgO barrier degradation due to interface oxygen Frenkel defects in scaled MTJ toward high-density STT-MRAM
poster

Microscopic modeling of MgO barrier degradation due to interface oxygen Frenkel defects in scaled MTJ toward high-density STT-MRAM

IRPS 2024 Main Conference

+10
Rina Takashima and 12 other authors

17 April 2024

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