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technical paper

IRPS 2022

March 28, 2021

Dallas, TX, United States

On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors

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Impact of Random Spatial Fluctuation in Non-Uniform Crystalline Phases on Multidomain MFIM Capacitor and Negative Capacitance FDSOI

IRPS 2022

+8Nitanshu Chauhan
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