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VIDEO DOI: https://doi.org/10.48448/vcsy-4m67
PAPER DOI: 10.1109/IRPS48227.2022.9764525

technical paper

IRPS 2022

March 28, 2021

Dallas, TX, United States

Study of Avalanche Behavior in 3 kV GaN Vertical P-N Diode Under UIS Stress for Edge-termination Optimization

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