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VIDEO DOI: https://doi.org/10.48448/0jh9-6q44
PAPER DOI: 10.1109/IRPS48228.2024.10529482

poster

IRPS 2024 Main Conference

April 17, 2024

Dallas, United States

Investigation of Interplays between Body Biasing and Hot Carrier Degradation (HCD) in Advanced NMOS FinFETs

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Next from IRPS 2024 Main Conference

A Comprehensive Hot Carrier Injection with Voltage Ramp Stress (HCI-VRS) through different model verification for more than Moore diversity application
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A Comprehensive Hot Carrier Injection with Voltage Ramp Stress (HCI-VRS) through different model verification for more than Moore diversity application

IRPS 2024 Main Conference

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