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Co Layer Resolved Measurement of Dzyaloshinskii
Dzyaloshinskii-Moriya interaction (DMI) that occurs in structural inversion asymmetric systems stabilizes chiral domain-walls (DWs) which is a key issue to achieve high performance spintronic applications such as memory and data storage devices with high speed and high durability 1-4. It is therefore important to analyze the strength of DMI and thus, there have been numerous efforts devoted to quantifying the DMI both theoretically and experimentally 4-6. Unfortunately, the inconsistency between theory and experiment inevitably occurs because the theory predicts the strength of DMI based on single interface, however, the experiments must be implemented based on at least, double interface because of Ex-Situ nature 2-6. Here, we first, measure the strength of DMI at Pt/Co single interface in In-Situ nature. To measure the strength of DMI at single interface, we set up In-Situ Magneto-Optical-Kerr-Effect (MOKE) microscopy with UHV magnetron sputtering chamber. Then, we quantified the strength of DMI with respect to Co layer thickness. Fig.1 clearly shows the plot of HDMI with respect to tCo based on Je's method 5.
References
1 S. S. P. Parkin, M. Hayashi, and L. Thomas, Science 320 (5873), 190-194. (2008).
2 I. E. Dzialoshinskii, Sov. Phys. JETP 5, 1259 (1957).
3 T. Moriya, Phys. Rev. 120, 91 (1960).
4 A. Fert, V. Cros, and J. Sampaio, Nat. Nanotechnol. 8, 152 (2013).
5 S.-G. Je, K.-J. Lee, and S.-B. Choe, Phys. Rev. B 88, 214401 (2013).
6 J. Cho, B. Koopmans, and C.-Y. You, Nat. Commun. 6, 7635 (2015).
Fig. 1 The plot of HDMI with respect to tCo.