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VIDEO DOI: https://doi.org/10.48448/m29w-zh89
PAPER DOI: 10.1109/IRPS48227.2022.9764496

technical paper

IRPS 2022

March 28, 2021

Dallas, TX, United States

Efficient Evaluation of the Time-Dependent Threshold Voltage Distribution Due to NBTI Stress Using Transistor Arrays

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