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VIDEO DOI: https://doi.org/10.48448/6506-v554
PAPER DOI: 10.1109/IRPS48227.2022.9764538

poster

IRPS 2022

March 28, 2021

Dallas, TX, United States

Static Performance and Reliability of 4H-SiC Diodes with P+ Regions Formed by Various Profiles and Temperatures

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