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VIDEO DOI: https://doi.org/10.48448/xb1t-jq36
PAPER DOI: 10.1109/IRPS48227.2022.9764450

poster

IRPS 2022

March 28, 2021

Dallas, TX, United States

Correlated Effects of Radiation and Hot Carrier Degradation on the Performance of LDMOS Transistors

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