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VIDEO DOI: https://doi.org/10.48448/9wfr-3356
PAPER DOI: 10.1109/IRPS48227.2022.9764600

poster

IRPS 2022

March 28, 2021

Dallas, TX, United States

Influence of Drain and Gate Potential on Gate Failure in Semi-Vertical GaN-on-Si Trench MOSFET

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