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technical paper

IRPS 2022

March 28, 2021

Dallas, TX, United States

Impact of TSV on TDDB Performance of Neighboring FinFET with HK/IL Gate Stacking

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Next from IRPS 2022

Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics
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Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics

IRPS 2022

+3Alexander GrillBarry O'Sullivan
Barry O'Sullivan and 5 other authors

28 March 2021

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