VIDEO DOI: https://doi.org/10.48448/4a2m-0r36

technical paper

ESSCIRC ESSDERC 2021

September 14, 2021

Italy

Impact of Hot Carrier Degradation on the Performances of Current Mirrors Based on a 55 nm BiCMOS Integrated Circuit Technology

Please log in to leave a comment

Downloads

SlidesTranscript English (automatic)

Next from ESSCIRC ESSDERC 2021

A 112–134-Gb/S PAM4 Receiver Using a 36-Way Dual-Comparator TI-SAR ADC in 7-nm FinFET
technical paper

A 112–134-Gb/S PAM4 Receiver Using a 36-Way Dual-Comparator TI-SAR ADC in 7-nm FinFET

ESSCIRC ESSDERC 2021

+11Declan CareySantiago Assuncion
Pedro Wilson de Abreu Farias Neto and 13 other authors

14 September 2021

Similar lecture

Monte Carlo Comparison of n-Type and p-Type Nanosheets with FinFETs: Effect of the Number of Sheets
technical paper

Monte Carlo Comparison of n-Type and p-Type Nanosheets with FinFETs: Effect of the Number of Sheets

ESSCIRC ESSDERC 2021

+4Geert HellingsFabian Bufler
Fabian Bufler and 6 other authors

14 September 2021

Stay up to date with the latest Underline news!

PRESENTATIONS

  • All Lectures
  • For Librarians
  • Resource Center
  • Free Trial
Underline Science, Inc.
1216 Broadway, 2nd Floor, New York, NY 10001, USA

© 2023 Underline - All rights reserved