Improving Ge-rich GST ePCM Reliability Through BEOL Engineering

September 14, 2021 • Italy

Andrea Redaelli-avatar-image
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Andrea Redaelli

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Franck Arnaud-avatar-image
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Franck Arnaud

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Remy Berthelon-avatar-image
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Remy Berthelon

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christian boccaccio

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Paolo Cappelletti

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Davide Codegoni-avatar-image
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Davide Codegoni

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Anna Gandolfo

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Enrico Gomiero-avatar-image
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Enrico Gomiero

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Jeremie Jasse-avatar-image
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Jeremie Jasse

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Andrea Lippiello-avatar-image
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Andrea Lippiello

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Paolo Mattavelli-avatar-image
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Paolo Mattavelli

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Elisa Petroni-avatar-image
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Elisa Petroni

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Rossella Ranica-avatar-image
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Rossella Ranica

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Giulia Samanni-avatar-image
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Giulia Samanni

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Juri Sandrini-avatar-image
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Juri Sandrini

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Luca Scotti-avatar-image
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Luca Scotti

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Andrea Serafini-avatar-image
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Andrea Serafini

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Improving Ge-rich GST ePCM Reliability Through BEOL Engineering

September 14, 2021 • Italy

Andrea Redaelli-avatar-image
SPEAKER

Andrea Redaelli

STMicroelectronics
Franck Arnaud-avatar-image
SPEAKER

Franck Arnaud

STMicroelectronics
Remy Berthelon-avatar-image
SPEAKER

Remy Berthelon

STMicroelectronics
christian boccaccio-avatar-image
SPEAKER

christian boccaccio

STMicroelectronics
Paolo Cappelletti-avatar-image
SPEAKER

Paolo Cappelletti

STMicroelectronics
Davide Codegoni-avatar-image
SPEAKER

Davide Codegoni

STMicroelectronics
Anna Gandolfo-avatar-image
SPEAKER

Anna Gandolfo

STMicroelectronics
Enrico Gomiero-avatar-image
SPEAKER

Enrico Gomiero

STMicroelectronics
Jeremie Jasse-avatar-image
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Jeremie Jasse

STMicroelectronics
Andrea Lippiello-avatar-image
SPEAKER

Andrea Lippiello

STMicroelectronics
Paolo Mattavelli-avatar-image
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Paolo Mattavelli

STMicroelectronics
Elisa Petroni-avatar-image
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Elisa Petroni

STMicroelectronics
Rossella Ranica-avatar-image
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Rossella Ranica

ST Microelectronics
Giulia Samanni-avatar-image
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Giulia Samanni

STMicroelectronics
Juri Sandrini-avatar-image
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Juri Sandrini

STMicroelectronics
Luca Scotti-avatar-image
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Luca Scotti

STMicroelectronics
Andrea Serafini-avatar-image
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Andrea Serafini

STMicroelectronics

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