Circuit Monitoring Across Design Life-Cycle in 28nm FD-SOI and 40nm Bulk CMOS Technologies

September 14, 2021 • Italy

doi: 10.48448/vfzt-tr25

Sylvain Clerc-avatar-image
SPEAKER

Sylvain Clerc

STMicroelectronics
Christian Dutto-avatar-image
SPEAKER

Christian Dutto

STMicroelectronics
Rohit Goel-avatar-image
SPEAKER

Rohit Goel

STMicroelectronics
Ricardo Gomez Gomez-avatar-image
SPEAKER

Ricardo Gomez Gomez

STMicroelectronics
Kedar Janardan Dhori-avatar-image
SPEAKER

Kedar Janardan Dhori

STMicroelectronics
Sebastien Marchal-avatar-image
SPEAKER

Sebastien Marchal

STMicroelectronics
Franck Pourchon-avatar-image
SPEAKER

Franck Pourchon

STMicroelectronics
Robin Wilson-avatar-image
SPEAKER

Robin Wilson

STMicroelectronics
aboutabstractauthors

Circuit Monitoring Across Design Life-Cycle in 28nm FD-SOI and 40nm Bulk CMOS Technologies

September 14, 2021 • Italy

doi: 10.48448/vfzt-tr25

Sylvain Clerc-avatar-image
SPEAKER

Sylvain Clerc

STMicroelectronics
Christian Dutto-avatar-image
SPEAKER

Christian Dutto

STMicroelectronics
Rohit Goel-avatar-image
SPEAKER

Rohit Goel

STMicroelectronics
Ricardo Gomez Gomez-avatar-image
SPEAKER

Ricardo Gomez Gomez

STMicroelectronics
Kedar Janardan Dhori-avatar-image
SPEAKER

Kedar Janardan Dhori

STMicroelectronics
Sebastien Marchal-avatar-image
SPEAKER

Sebastien Marchal

STMicroelectronics
Franck Pourchon-avatar-image
SPEAKER

Franck Pourchon

STMicroelectronics
Robin Wilson-avatar-image
SPEAKER

Robin Wilson

STMicroelectronics

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