Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI

September 14, 2021 • Italy

doi: 10.48448/3bnc-4v98

Martin Rack-avatar-image
SPEAKER

Martin Rack

Université Catholique de Louvain
Quentin Courte-avatar-image
SPEAKER

Quentin Courte

Université Catholique de Louvain
Dimitri Lederer-avatar-image
SPEAKER

Dimitri Lederer

Université Catholique de Louvain
L Nyssens-avatar-image
SPEAKER

L Nyssens

Université Catholique de Louvain
Jean-Pierre Raskin-avatar-image
SPEAKER

Jean-Pierre Raskin

Université Catholique de Louvain
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Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI

September 14, 2021 • Italy

doi: 10.48448/3bnc-4v98

Martin Rack-avatar-image
SPEAKER

Martin Rack

Université Catholique de Louvain
Quentin Courte-avatar-image
SPEAKER

Quentin Courte

Université Catholique de Louvain
Dimitri Lederer-avatar-image
SPEAKER

Dimitri Lederer

Université Catholique de Louvain
L Nyssens-avatar-image
SPEAKER

L Nyssens

Université Catholique de Louvain
Jean-Pierre Raskin-avatar-image
SPEAKER

Jean-Pierre Raskin

Université Catholique de Louvain

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