VIDEO DOI: https://doi.org/10.48448/1j5d-gg46

technical paper

EMC 2021

June 24, 2021

Live on Underline

Control of Nucleation Layers for (110) Oriented ZnTe Thin Film Growth on Sapphire r, S-Plane Nano-Facet Substrates

Please log in to leave a comment

Downloads

Transcript English (automatic)

Next from EMC 2021

Spatially Resolved Fourier Transform Impedance Spectroscopy—A Technique to Rapidly Characterize Composite Interfaces and a Study of Quantum Dot/Epitaxial Graphene/SiC Optoelectronic Devices
technical paper

Spatially Resolved Fourier Transform Impedance Spectroscopy—A Technique to Rapidly Characterize Composite Interfaces and a Study of Quantum Dot/Epitaxial Graphene/SiC Optoelectronic Devices

EMC 2021

+3Mathew Kelley
Mathew Kelley and 5 other authors

24 June 2021

Similar lecture

Plasma Etching of High Aspect ratio Sapphire Antireflection Nanostructures Using Multilayer Etching Mask
poster

Plasma Etching of High Aspect ratio Sapphire Antireflection Nanostructures Using Multilayer Etching Mask

EIPBN 2021

Yi-An ChenI-Te Chen
Chih-Hao Chang and 2 other authors

01 June 2021

Stay up to date with the latest Underline news!

Select topic of interest (you can select more than one)

PRESENTATIONS

  • All Lectures
  • For Librarians
  • Resource Center
  • Free Trial
Underline Science, Inc.
1216 Broadway, 2nd Floor, New York, NY 10001, USA

© 2023 Underline - All rights reserved