EIPBN 2021

June 02, 2021

United States

Would you like to see your presentation here, made available to a global audience of researchers?
Add your own presentation or have us affordably record your next conference.

Please log in to leave a comment

Downloads

SlidesTranscript English (automatic)

Next from EIPBN 2021

Internal Layered Structures of UV-Cured Thin Films after Sequential Vapor Infiltration Analyzed by X-ray Reflectivity Measurements
technical paper

Internal Layered Structures of UV-Cured Thin Films after Sequential Vapor Infiltration Analyzed by X-ray Reflectivity Measurements

EIPBN 2021

+1Masaru NakagawaKohei Chiba
Kohei Chiba and 3 other authors

02 June 2021

Similar lecture

Revisiting Gate-Induced Drain-Leakage in Nanowire FETs for 1T-DRAM
poster

Revisiting Gate-Induced Drain-Leakage in Nanowire FETs for 1T-DRAM

DRC 2022

Jaiswal Anupam Kumar and 2 other authors

27 May 2022

Stay up to date with the latest Underline news!

Select topic of interest (you can select more than one)

PRESENTATIONS

  • All Presentations
  • For Librarians
  • Resource Center
  • Free Trial
Underline Science, Inc.
1216 Broadway, 2nd Floor, New York, NY 10001, USA

© 2025 Underline - All rights reserved