GaN power HEMTs are known to offer high switching speed, low on-resistance and much better FOM when compared to their silicon counterparts. However, the ability to operate with high power density in a smaller form factor presents new challenges for reliable and robust operation. Traditional gate driver designs for silicon-based power devices are catered to lower frequencies with large tolerance on the gate voltage swing. They do not adequately address some of the reliability issues that are unique to GaN power transistors. This talk will provide a quick review on the gate driving requirements and limitations for GaN power HEMTs. This is followed by a survey of novel smart gate driving techniques that can further exploit the performance and enhance the reliability of GaN power devices. Topics to be covered include intelligent gate driving schemes such as active gate driving, dead time optimization, and current balancing. Emphasis will be given to designs that can be integrated and those that can monitor the devices for optimum performance and safe operation. Protection features such as short-circuit detection, gate overvoltage prevention, temperature monitoring and compensation will also be discussed. Monolithic integration of power GaN ICs is an exciting area of development with increasingly sophisticated designs reported in recent years. Fully integrated GaN building blocks and state of the art designs will be addressed.

Smart Gate Driver ICs for GaN Power Transistors

<br>**Presenter:** 
<br>Wai Tung Ng, University of Toronto, Canada

Keynote: Smart Gate Driver ICs for GaN Power Transistors

keynote

The IEEE Workshop on Wide Bandgap Power Devices & Applications (WiPDA) provides a forum for device scientists, circuit designers, & application engineers from the Power Electronics & Electron Devices Societies to share technology updates, research findings, experience & potential applications.

**Topics of interest**

* Heteroepitaxial & Bulk Materials Growth
* Gate Dielectrics & Surface Passivation
* Device Structures & Fabrication Techniques
* Device Characterization & Modeling
* Very-High Efficiency or Compact Converters
* Safe Operating Areas of Wide Bandgap Devices, Including Short Circuit, Spike, & Transient Tolerance
* Harsh Environment (High Temperature) Operation & Reliability
* Packaging Power Modules & ICs
* Hard-Switched & Soft-Switched Application Analysis
* Gate Drive & Other Auxiliary Circuits
* High-Performance Passive Components
* Applications in Renewable Energy & Energy Storage, Transportation, Industrial Drives, & Grid Power Systems
* Wide Band Gap System Design Philosophies & Strategies
* Radio Frequency (RF) GaN (New)
* Technology Roadmap of Wide Bandgap Including Devices, Applications and Packaging (New)

### Please select the button below to view and download the session papers. The Virtual Proceedings PDF can be downloaded [here.](https://drive.google.com/file/d/171y2_u63V-pc9-bC-eZgHLzJou2oCfST/view?usp=sharing)

[![](https://assets.underline.io/uploads/markdown_image/1/image/c8e1b0a2881d3bb0a75ece4761f43c9f.png)](https://drive.google.com/drive/folders/1GWEFLzH6K4aUBaJiBFJDw4x9sKLTl6-g?usp=sharing)


This event requires a registration to attend, please register [here](https://web.cvent.com/event/536cea3d-4c0d-4d50-8939-529979d80785/summary) to purchase a ticket. 

IEEE WiPDA 2021

The IEEE Workshop on Wide Bandgap Power Devices & Applications (WiPDA) provides a forum for device scientists, circuit designers, & application engineers from the Power Electronics & Electron Devices Societies to share technology updates, research findings, experience & potential applications.

Wai Tung Ng

1

Presentations

Smart Gate Driver ICs for GaN Power Transistors

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