Chris Kim
University of Minnesota, United States
thermal analysis
failure analysis
electromigration
power grids
sub-sampling
extreme temperature
reliability testing
reliability theory
power grid
on-chip heater
stress
synthesizable odometer
cryogenic
ring oscillator
analog waveform
5
presentations
SHORT BIO
Chris H. Kim is a professor at the University of Minnesota. His group has expertise in digital, mixed-signal, and memory IC design, with special emphasis on circuit reliability, hardware security, memory circuits, radiation effects, time-based circuits, beyond-CMOS technologies, and machine learning hardware design.
Presentations
Electromigration Test Chip Experiments From Realistic Power Grid Structures: Failure Trend Comparison and Statistical Analysis
Yong Hyeon Yi and 5 other authors
Extreme Temperature Characterization of Amplifier Response Up to 300 Degrees Celsius Using Integrated Heaters and On-Chip Samplers
Hanzhao Yu and 2 other authors
A Calibration - Free Synthesizable Odometer Featuring Automatic Frequency Dead Z one Escape and Start - up Glitch Removal
Tahmida Islam and 6 other authors
Novel methodology for temperature-aware electromigration assessment in on-chip power grid: simulations and experimental validation
Armen Kteyan and 2 other authors
Energy-Efficient Deep Neural Network Design: From Time-based Circuits to Layer-wise Pruning
Chris Kim