This paper reviews the reliability of Solid-State Drives (SSDs) based on NAND Flash memory with a focus comparing enterprise SSDs using TLC and QLC NAND. The paper analyzes various datasets including internal qualification methods and field studies. The data indicates that QLC SSDs have similar reliability to TLC SSDs, when NAND reliability mechanisms are sufficiently mitigated. Tradeoffs related to NAND differences and reliability mitigations and the resulting effect on performance, QoS, and endurance are highlighted.

Comparing the Reliability of Solid-State Drives Based on TLC and QLC NAND Flash Memories

3A (Memory Reliability)

technical paper

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On behalf of the Management Committee of the IEEE International Reliability Physics Symposium (IRPS) and the IRPS Board of Directors, it gives me great pleasure to extend a warm welcome to all who are planning to attend the IRPS 2024, scheduled to take place from April 14-18, 2024, in Dallas, TX. 
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**About IRPS** 
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The IEEE International Reliability Physics Symposium (IRPS) is the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability. IRPS seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic assemblies through an improved understanding of both the physics of failure as well as the application environment. 

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Comparing the Reliability of Solid-State Drives Based on TLC and QLC NAND Flash Memories

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