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Physically unclonable function (PUF), harnessing inherent stochastic variation of physical properties originating from the manufacturing process, is a crucial part of hardware security primitives 1. PUF offers more robust information security than the conventional software-based ones. To date, owing to the compatibility to complementary-metal-oxide-semiconductor (CMOS) technology, silicon-based PUFs have been widely investigated 2. However, their reliability with environmental fluctuations and susceptibility to external machine learning attacks are yet to be ascertained. Recently, graphene- or memristor-based PUFs were proposed and found out to be effective in resolving such issues 3,4. However, their analog output inevitably involves additional circuit modules or analogue-to-digital converter, requiring significant power consumption and area overhead.
Here, we demonstrate highly reliable spintronic PUFs based on field-free spin-orbit torque (SOT) switching in an IrMn/CoFeB/Ta/CoFeB structure. We show that the switching polarity of the perpendicular magnetization of the top CoFeB can be randomly distributed by manipulating the exchange bias directions of the bottom IrMn/CoFeB. Figure 1 shows stochastic field-free SOT switching polarity after the randomization process of the bottom exchange-biased layers. Ideal PUF properties are found in the spintronic PUFs: high entropy close to unity, uniqueness with an inter-Hamming distance of 0.5 and reconfigurability. Furthermore, the spintronic PUFs generate binary digital outputs, potentially eliminating the need for analog-to-digital converters and error correction codes. We observed a zero bit-error rate in 5×104 repetitive measurements which demonstrates the high reliability. Due to the exchange-biased bottom layers, robustness against external magnetic fields are secured. These, when integrated with magnetic random-access memory in particular, are expected to promote scalable and energy-efficient hardware information security
References 1 Y. Gao, S. F. Al-Sarawi, D. Abbott, Nat. Electron., 3, 81 (2020)
2 J. L. Zhang, G. Qu, Y. Q. Lv, Q. Zhou, J. Comput. Sci. Technol., 29, 664 (2014)
3 A. Dodda, S. Subbulakshmi Radhakrishnan, S. Das, Nat. Electron., 4, 364 (2021)
4 R. A. John, N. Shah, N. Mathews, Nat. Commun., 12, 3681 (2021)

