VIDEO DOI: https://doi.org/10.48448/h97q-8y03

technical paper

DRC 2022

May 27, 2022

United States

Movement of Current Filaments and its Impact on Avalanche Robustness in Vertical GaN P-N diode Under UIS stress

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A Composite TE-TFE-FE Model for Schottky Barrier Reverse Current over the Entire Electric-Field Range
technical paper

A Composite TE-TFE-FE Model for Schottky Barrier Reverse Current over the Entire Electric-Field Range

DRC 2022

Li Wenshen
Li Wenshen and 2 other authors

27 May 2022

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