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VIDEO DOI: https://doi.org/10.48448/1b9m-qn22
PAPER DOI: 10.1109/IRPS48227.2022.9764502

technical paper

IRPS 2022

March 28, 2021

Dallas, TX, United States

Fe-Traps Influence on Time dependent Breakdown Voltage in 0.1 µm GaN HEMTs for 5G applications

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