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VIDEO DOI: https://doi.org/10.48448/bqg8-d786
PAPER DOI: 10.1109/IRPS48227.2022.9764540

technical paper

IRPS 2022

March 28, 2021

Dallas, TX, United States

Observation of Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress

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