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IRPS 2022

March 28, 2021

Dallas, TX, United States

Electric Field Impact on Lateral Charge Diffusivity in Charge Trapping 3D NAND Flash Memory

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Frequency dependant gate oxide TDDB model

Frequency dependant gate oxide TDDB model

IRPS 2022

+4Florian CachoMelissa Arabi
Melissa Arabi and 6 other authors

28 March 2021

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