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technical paper

IRPS 2022

March 28, 2021

Dallas, TX, United States

New Insight into the Aging Induced Retention Time Degradation of Advanced DRAM Technologies

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Optical Emission Correlated to Bias Temperature Instability in SiC MOSFETs

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+2Thomas AichingerMaximilian Feil
Maximilian Feil and 4 other authors

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