VIDEO DOI: https://doi.org/10.48448/xh49-9w07

poster

OWSD 6th GENERAL ASSEMBLY AND INTERNATIONAL CONFERENCE

November 09, 2021

Germany

Hardware in the Loop Process instrumentation and control Trainer

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Next from OWSD 6th GENERAL ASSEMBLY AND INTERNATIONAL CONFERENCE

Using phenological metrics derived from sentinel 2 to estimate wheat yield in semid arid regions
poster

Using phenological metrics derived from sentinel 2 to estimate wheat yield in semid arid regions

OWSD 6th GENERAL ASSEMBLY AND INTERNATIONAL CONFERENCE

Adra IDRISSI
Adra IDRISSI and 2 other authors

09 November 2021

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