Italy

**Please read the paper on the following link:**

https://1worldcontent.com/ess/9106.pdf

**Abstract:**

In this work, we report the characterization and modeling of a 14 nm bulk FinFET technology from room-temperature down to 4.6 K. A cryogenic device model is used which shows excellent fit to measured data and can accurately predict the performance of the devices at low temperatures. The obtained results show that a tailored cryogenic FinFET technology could achieve a sharp reduction of dissipated power by reducing the drive bias. Such technology has potential for strong impact e.g. in quantum computing, by enabling integration of dense advanced cryogenic ICs inside the cryostat.

ESSCIRC ESSDERC 2021

Cryogenic Characterization and Modeling of 14 nm Bulk FinFET Technology

14-nm finfet

subthreshold swing

cryogenic

The aim of ESSCIRC and ESSDERC is to provide an annual European forum for the presentation and discussion of recent advances in solid-state devices and circuits.
The level of integration for system-on-chip design is rapidly increasing.

This is made available by advances in semiconductor technology. Therefore, more than ever before, a deeper interaction among technologists, device experts, IC designers, and system designers is necessary. ESSCIRC and ESSDERC are governed by a common Steering Committee and share Plenary Keynote Presentations and Joint Sessions bridging both device and circuit communities.

Highlights:
* 3 joint keynote presentations
* 3 keynote presentations ESSCIRC
* 3 keynote presentations ESSDERC
* Invited papers with overall coverage of all aspects of advanced devices and circuits
* Presentation of IEEE and ESSCIRC/ESSDERC Awards
* Educational Events

JOINT PLENARY talks live broadcast: September 13, 2021<br>
ESSCIRC and ESSDERC KEYNOTE talks live broadcast: September 15, 2021<br>
LIVE Q&A INTERACTIVE sessions for all Conference Technical sessions: September 14 – 16 – 17, 2021<br>
LIVE Q&A INTERACTIVE sessions for all Educational Events: September 20-21-22, 2021<br>
(on demand videos available from September 6 until November 30, 2021)

**Please see here for the [ESSCIRC Guide](https://drive.google.com/file/d/10dghzuv4aQBty4QfTIY9Q8hXyqsue8Le/view?usp=sharing), [ESSDERC Guide](https://drive.google.com/file/d/10dx9y2tm9cHPDa4upNUYjfXCf44aPry5/view?usp=sharing), and the [Program at a Glance](https://drive.google.com/file/d/10eU0OLTXEpiNzI5hkqv4mSr43T8cedPP/view?usp=sharing)**


To access ESSCIRC ESSDERC 2021, you must pre-register for the conference.  Instructions on how to access the event will be provided directly to attendees and included on the ESSCIRC ESSDERC conference website. [Register now](https://www.esscirc-essderc2021.org/).

Please register for the ESSCIRC conference to join the event.

The aim of ESSCIRC and ESSDERC is to provide an annual European forum for the presentation and discussion of recent advances in solid-state devices and circuits.
The level of integration for system-on-chip design is rapidly increasing.

This is made available by advances in semiconductor technology. Therefore, more than ever before, a deeper interaction among technologists, device experts, IC designers, and system designers is necessary. ESSCIRC and ESSDERC are governed by a common Steering Committee and share Plenary Keynote Presentations and Joint Sessions bridging both device and circuit communities.





technical paper

**Please read the paper on the following link:**

https://1worldcontent.com/ess/9167.pdf

**Abstract:**

Magnetic Tunnel Junctions (MTJs) constitute thenovel memory element in STT-MRAM, which is ramping toproduction at major foundries as an eFlash replacement. MTJswitching exhibits a stochastic behaviour due to thermal fluctu-ations, which is modelled by s-LLGS and Fokker-Planck (FP)equations. This work quantifies the effect of thermal noise,and proposes and benchmarks a new formulation for MTJinitial conditions to accurately match thermal noise results fromstatistical simulation. Further, Finite Volume Method (FVM) andanalytical solvers for the FP equation are implemented andbenchmarked. To deploy an MTJ model for circuit design, itmust be calibrated against silicon data. To address this challenge,this work presents a scheme to fit MTJ parameters to a given setof measured current, switching time and error rate data points.

A Fokker-Planck Solver to Model MTJ Stochasticity

**Please read the paper on the following link:**

https://1worldcontent.com/ess/9251.pdf

**Abstract:**

A semi-empirical model for the optical properties of SiGe alloys is proposed, based on physical considerations and the summation of Tauc-Lorentz and parametric oscillators. The key parameters of the oscillators are intuited from the optical transition and the symmetry points in the band structure. The model is fitted on extensive experimental data, for different temperatures, germanium concentrations and for both unstrained and strained on (100) Silicium wafer cases. This model can be used in optical simulation tools, in order to help the design of optoelectronic devices based on SiGe materials.

Semi-Empirical Model for Optical Properties of Si₁−xGex Alloys Accounting for Strain and Temperature

**Please read the paper on the following link:**

https://1worldcontent.com/ess/9265.pdf

**Abstract:**

This paper presents a new method to reliably simulate the PDE and jitter for realistic 3D device simulations of SPAD devices. This method is based on the use of electric field lines to mimic the carriers\' trajectories, which allows the transformation of a 3D problem into a multitude of 1D problems. This idea is applied to the McIntyre model for breakdown avalanche probability to calculate PDE, but also for jitter prediction using a dedicated advection-diffusion model. The results obtained numerically are compared with an extensive series of measurements and show a good agreement on a wide variety of device designs.

Comprehensive Modeling and Characterization of Photon Detection Efficiency and Jitter in Advanced SPAD Devices

**Please read the paper on the following link:**

https://1worldcontent.com/ess/9213.pdf

**Abstract:**

In this work, a wafer-scale fabrication of biologically sensitive Si nanowire FET is demonstrated for pH sensing and electrical detection of DNA hybridization. Based on conventional “top-down” CMOS compatible technology, our bioFETs explore a wide range of design (nanowires (NW), nanoribbons (NR), and honeycomb (HC) structures) with opening access scaled down to only 120 nm. After device fabrication, IDS-VBG transfer and IDS-VDS output characteristics show a conventional n-type FET behavior with an ION/IOFF value higher than 105, as well as an increase of threshold voltage (VTH) as the NW width is reduced. Then, using a capacitive coupling in our dual-gated Si bioFETs, the pH sensitivity is enhanced with a pH response up to 600 mV/pH. Finally, the increase of threshold voltage of n-type SiNWs due to the hybridized target DNA molecules is successfully detected

Wafer-Scale Fabrication of Biologically Sensitive Si Nanowire FET: From pH Sensing to Electrical Detection of DNA Hybridization

**Please read the paper on the following link:**

https://1worldcontent.com/ess/9258.pdf

**Abstract:**

A CMOS industry compatible integrated resonant SiN gyroscope was fabricated with the STMicroelectronics 300 mm Photonic R&D platform. For the first time, both active Si&Ge components and low loss SiN resonant ring are integrated in an optical gyroscope, based on a ring resonator coupled to a Mach-Zehnder Interferometer. Modeling of the shot noise resolution of our device is given, resulting in a resolution of 1.08deg/s. Experimental measurement show a static gain in sensitivity of 56% compared to a single ring with the same footprint.

Design and Fabrication of a Ring-Coupled Mach-Zehnder Interferometer Gyroscope

**Please read the paper on the following link:**

https://1worldcontent.com/ess/9287.pdf

**Abstract:**

In this work we propose and experimentally validate a relaxation oscillator architecture with ultra-high tuning range (higher than 400%, from 5KHz to more than 25kHz when the control voltage is varied from 2.5 to 5V) that exploits the reversible metal-insulator transition in 2-terminal Vanadium Dioxide thin film devices loaded to a MOSFET common source amplifier. We propose and validate an analytical model that connects key output signal metrics to the intrinsic properties of the phase-change VO2 device employed. In addition, we demonstrate RF and optical sensing capabilities, with sensitivities of 4.64 Hz/dBm and 4.23 Hz/mW to RF and Optical Power, respectively.

High Tuning Range Spiking 1R-1T VO2 Voltage-Controlled Oscillator for Integrated RF and Optical Sensing

**Please read the paper on the following link:**

https://1worldcontent.com/ess/9158.pdf

**Abstract:**

This paper benchmark the intrinsic trade-off between two essential modules of gate-all-around GAA nanosheet (NS)FETs viz. inner-spacers (ISPs) epi-induced stress in the channel. While having both ISPs and the stress is the best-case scenario for NSFET, it comes with enhanced process challenges and performance risks: poor epi-quality resulting in a no-channel stress scenario. While inner-spacers are important to parasitic capacitance reduction, we show that having intrinsic epi-stress is more beneficial and provides a better performance trade-off. We further evaluate the impact of inner-spacer κ-value and enhanced epi-volume for the two different cases. Finally, we have performed self-heating studies to show how skipping inner spacers can provide additional reduction in peak temperature.

Performance Trade-Off Scenarios for GAA Nanosheet FETs Considering Inner-Spacers and Epi-Induced Stress: Understanding & Mitigating Process Risks

**Please read the paper on the following link:**

https://1worldcontent.com/ess/9202.pdf

**Abstract:**

We explore charge and spin transport properties of bilayer CrI3 controlled by an external electric field. To this aim, we focus on two different device structures, namely Monolayer/Bilayer/Monolayer CrI3 and Bilayer/Bilayer/Bilayer CrI3. The electric field is only applied to the central Bilayer-channel. In the first device, we inject only a single spin from the ferromagnetic Monolayer CrI3 which allows us to study its effect on the spin transport properties of a spin transistor. The second structure is based on the injection of both spins, that are later filtered, resulting in spin-filter device.

Electric-Field Controlled Spin Transport in Bilayer CrI3

**Please read the paper on the following link:**

https://1worldcontent.com/ess/9141.pdf

**Abstract:**

We present a circuit model for the co-simulation of spin qubits with their control and readout electronics in a common simulation environment. The model, completely simulated in Spectre, can handle all the basic operations on spin qubits, including readout and universal single and 2-qubit quantum gates. Furthermore, the model has the ability to include nonidealities such as decoherence and noisy control signals, thereby paving the way for circuit-technology co-optimization for spin-based quantum computation.

Circuit Model for the Efficient Co-Simulation of Spin Qubits and Their Control & Readout Circuitry

"**Please read the paper on the following link:**

https://1worldcontent.com/ess/9226.pdf

**Abstract:**

Spin-Transfer Torque Magnetic Tunnel Junctions (STT-MTJ) are devices featuring stochastic properties. They are promising candidates for non-volatile memory or true random number generators. To design reliable hybrid CMOS circuits including STT-MTJs, one needs to use a compact model accounting for its stochasticity in the circuit simulations. This paper proposes a compact model that accurately mimics the MTJ stochastic switching behavior and meets the needs of fast execution time. The relevance of such a model together with its fast execution velocity are illustrated with a bitstream generator.

Cryogenic Characterization and Modeling of 14 nm Bulk FinFET Technology

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Next from ESSCIRC ESSDERC 2021

A Fokker-Planck Solver to Model MTJ Stochasticity

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Cryogenic Characterization and Modeling of 14 nm Bulk FinFET Technology

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Next from ESSCIRC ESSDERC 2021

A Fokker-Planck Solver to Model MTJ Stochasticity

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Bias Voltage DAC Operating at Cryogenic Temperatures for Solid-State Qubit Applications

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PRESENTATIONS

CONFERENCES

COMPANY

RESOURCES

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