Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network

September 14, 2021 • Italy

doi: 10.48448/f1g0-ej24

Christoph Wilhelmer-avatar-image
SPEAKER

Christoph Wilhelmer

Technische Universität Wien, Institute for Microelectronics
Lukas Cvitkovich-avatar-image
SPEAKER

Lukas Cvitkovich

Technische Universität Wien, Institute for Microelectronics
Al-Moatasem Bellah El-Sayed-avatar-image
SPEAKER

Al-Moatasem Bellah El-Sayed

Technische Universität Wien, Institute for Microelectronics / Nanolayers Research Computing, Ltd
Tibor Grasser-avatar-image
SPEAKER

Tibor Grasser

Technische Universität Wien, Institute for Microelectronics
Markus Jech-avatar-image
SPEAKER

Markus Jech

Institute for Microelectronics, TU Wien;
Dominic Waldhoer-avatar-image
SPEAKER

Dominic Waldhoer

CDL for Single-Defect Spectroscopy at the Institute for Microelectronics, TU Wien, 1040 Vienna, Austria
aboutabstractauthors

Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network

September 14, 2021 • Italy

doi: 10.48448/f1g0-ej24

Christoph Wilhelmer-avatar-image
SPEAKER

Christoph Wilhelmer

Technische Universität Wien, Institute for Microelectronics
Lukas Cvitkovich-avatar-image
SPEAKER

Lukas Cvitkovich

Technische Universität Wien, Institute for Microelectronics
Al-Moatasem Bellah El-Sayed-avatar-image
SPEAKER

Al-Moatasem Bellah El-Sayed

Technische Universität Wien, Institute for Microelectronics / Nanolayers Research Computing, Ltd
Tibor Grasser-avatar-image
SPEAKER

Tibor Grasser

Technische Universität Wien, Institute for Microelectronics
Markus Jech-avatar-image
SPEAKER

Markus Jech

Institute for Microelectronics, TU Wien;
Dominic Waldhoer-avatar-image
SPEAKER

Dominic Waldhoer

CDL for Single-Defect Spectroscopy at the Institute for Microelectronics, TU Wien, 1040 Vienna, Austria

similar conferences

conference cover

ESSCIRC ESSDERC 2021

ESSCIRC ESSDERC 2021

next from ESSCIRC ESSDERC 2021view all
lecture cover

Masato Kohtani

Power Calibration Loop with High Accuracy of 10 dBm ±0.5 dB for a 77-GHz Radar Application

ESSCIRC ESSDERC 2021 • Sep 14, 2021

similar lectures

PLATFORM

  • Home
  • Events
  • Video Library

COMPANY

RESOURCES

Underline Science, Inc.
1216 Broadway, 2nd Floor, New York, NY 10001, USA

© 2020 Underline - All rights reserved

Made with ❤️ in New York City