Machine Learning Prediction of Defect Structures in Amorphous Silicon Dioxide

September 14, 2021 • Italy

Diego Milardovich-avatar-image
SPEAKER

Diego Milardovich

Technische Universität Wien, Institute for Microelectronics
Al-Moatasem Bellah El-Sayed-avatar-image
SPEAKER

Al-Moatasem Bellah El-Sayed

Technische Universität Wien, Institute for Microelectronics / Nanolayers Research Computing, Ltd
Tibor Grasser-avatar-image
SPEAKER

Tibor Grasser

Technische Universität Wien, Institute for Microelectronics
Markus Jech-avatar-image
SPEAKER

Markus Jech

Technische Universität Wien, Institute for Microelectronics
Dominic Waldhoer-avatar-image
SPEAKER

Dominic Waldhoer

CDL for Single-Defect Spectroscopy at the Institute for Microelectronics, TU Wien, 1040 Vienna, Austria
aboutabstractauthors

Machine Learning Prediction of Defect Structures in Amorphous Silicon Dioxide

September 14, 2021 • Italy

Diego Milardovich-avatar-image
SPEAKER

Diego Milardovich

Technische Universität Wien, Institute for Microelectronics
Al-Moatasem Bellah El-Sayed-avatar-image
SPEAKER

Al-Moatasem Bellah El-Sayed

Technische Universität Wien, Institute for Microelectronics / Nanolayers Research Computing, Ltd
Tibor Grasser-avatar-image
SPEAKER

Tibor Grasser

Technische Universität Wien, Institute for Microelectronics
Markus Jech-avatar-image
SPEAKER

Markus Jech

Technische Universität Wien, Institute for Microelectronics
Dominic Waldhoer-avatar-image
SPEAKER

Dominic Waldhoer

CDL for Single-Defect Spectroscopy at the Institute for Microelectronics, TU Wien, 1040 Vienna, Austria

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