VIDEO DOI: https://doi.org/10.48448/4c2v-x228

technical paper

ECAI 2020

August 31, 2020

Live on Underline

Minimizing and recovering from the effect of concept drift via feature selection

Please log in to leave a comment

Downloads

Transcript English (automatic)

Next from ECAI 2020

A Two-Stream Network with Image-to-Class Deep Metric for Few-Shot Classification
technical paper

A Two-Stream Network with Image-to-Class Deep Metric for Few-Shot Classification

ECAI 2020

Qinghua Gu
Qinghua Gu

31 August 2020

Similar lecture

Stay up to date with the latest Underline news!

PRESENTATIONS

  • All Lectures
  • For Librarians
  • Resource Center
  • Free Trial
Underline Science, Inc.
1216 Broadway, 2nd Floor, New York, NY 10001, USA

© 2023 Underline - All rights reserved