IRPS 2025 Main Conference

April 03, 2025

Monterey, United States

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keywords:

phase-change memory

multi-layer engineering

ge-rich gesbte

This study investigates the  by Multi-Layer (ML) engineering of off‑stoichiometric Ge-rich GeSbTe alloys to improve performance and reduce electrical variability while maintaining high-temperature stability. We show that tuning the Ge layer thickness and Nitrogen content of Ge(N)//GeSbTe ML stacks improves the layer stability at high temperature, the resistance window, and the SET reliability. Thicker Ge layers enhance the ML integrity, while higher N content improves the resistance window but compromises SET stability at high temperatures...

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