#### Welcome to the 59th IEEE International Reliability Physics Symposium (IRPS)! 

For 59 years, IRPS has been the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all other parts of the world, IRPS seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic systems through an improved understanding of both the physics of failure as well as the application environment.

IRPS provides numerous opportunities for attendees to increase their knowledge and understanding of all aspects of microelectronics reliability. It is also an outstanding chance to meet and network with reliability colleagues from around the world.

##### General Chair Welcome Message

Welcome to IRPS 2021! While we would all prefer to be meeting in person in Monterey, the IRPS Management and Technical Committees have put together a comprehensive virtual program this year, and we believe that this program, delivered to you via a versatile online platform, is consistent with the quality that attendees have come to expect based on IRPS' history as the premier event in reliability physics. Indeed, in order to emulate the traditional in-person symposium as closely as possible, many aspects will be conducted live such as the opening session and keynotes, the Q&A and authors' corner, the poster session and workshops, and many of the talks.

As is the case every year, the heart of the symposium is the technical program, which features twenty sessions comprising nearly ninety oral presentations and over fifty poster presentations. Highlighted among these are our focus sessions on emerging memory, neuromorphic computing, and RF/mmW/5G reliability. Of course, our traditional topics such as the reliability of transistors, dielectrics, metal/back-end, packaging, wide-bandgap devices, and many others are also represented. The program features twenty invited speakers, spanning these topics as well as many others, and additionally we have an exciting keynote talk leading off each of the four days of the program, covering memory, silicon carbide reliability, 6G communications, and the internet of things all presented by world-class experts.

Due to the virtual format, the symposium spans four days this year instead of the traditional five, and the tutorial program is integrated directly into the technical program, featuring, tutorials spanning from our focus topics to state--of-the-art areas of reliability physics such as FinFET self-heating. Further, the Year in Review features a summary of the past year's research highlights in the areas of gate all-around vs FinFET reliability, advances in reliability testing, and a review of the industry council on ESD achievements activities, and initiatives. We also feature key elements from our partner conference, the International Electrostatic Discharge Workshop (IEW), in the program, and additionally highlight the best paper form our sister European conference (ESREF) as well as the IEEE International Integrated Reliability Workshop (IIRW). Our workshops will also return in a virtual format this year.

During the extended lunch break, virtual visits with exhibitors can be undertaken, and a new career fair feature is being introduced to allow students and others to meet with prospective employers. And, even though IRPS is virtual this year, to give at least a taste of being live, we have available on the platform two live web cam feeds direct from the Monterey Bay Aquarium!

Finally, I would like to express my sincere gratitude to our patrons, without whose sponsorship IRPS would not be possible, and to all of you - our attendees, for whom the symposium has been put together this year, as it has been for nearly sixty years!

##### Robert J. Kaplar, General Chair of 2021 IRPS Management Committee

[![](https://assets.underline.io/markdown_image/1/image/6935e7951e489a84e86147660aa2b775.png)](https://drive.google.com/file/d/1cE9Z2aZeXE7h1VGeuUxsdSUA7luTdPLs/view?usp=sharing)
[![](https://assets.underline.io/markdown_image/1/image/66a121e255fbb98e83ec9d622e657bca.png)](https://drive.google.com/drive/folders/1VF0W8arXNVB4v1SjAOFjSJ4_l6TxOyKZ?usp=sharing)
[![](https://assets.underline.io/markdown_image/1/image/6989ec6eae3183b9797270bfc1418850.png)](https://drive.google.com/drive/folders/1dDh8zo7bPZipcoLjUDzRIkiovwN2nsCk?usp=sharing)
[![](https://assets.underline.io/markdown_image/1/image/2c43cb76f3abd21257caf088bd8f4b65.png)](https://irps.org/)
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A small contribution is needed to access the content of this event. It will help us organize even better events in the future.

Available content:
* 165 transcribed video presentations of accepted papers with links to proceedings and slides
* 75 posters
* 45 tutorial presentations
* 4 keynote presentations

Registration fee: 100 USD

IRPS 2021 Main Conference

IRPS provides numerous opportunities for attendees to increase their knowledge and understanding of all aspects of microelectronics reliability. It is also an outstanding chance to meet and network with reliability colleagues from around the world. Join us!

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