Revealing the Invisible: How to Prepare Hidden Targets by Mechanical and Ion Beam Preparation (for SEM)

**Thomas Pfeifer** / Advanced Workflow Specialist (AWS)

![](https://assets.underline.io/uploads/markdown_image/1/image/2c7be5d21657a0b1e420df02e45835ba.jpg)

Break Out Session 1: Cross sectioning and flat milling:  Ion milling for semi-conductor, aerospace, automotive,  painting and coating or similar application fields.

**Konrad Winkler** / Product Manager, EM sample preparation

![](https://assets.underline.io/uploads/markdown_image/1/image/c2a93765cd6998b7684713d7c7aeadbf.png)

Break Out Session 2: For temperature-sensitive samples: Ion milling for tyres, paper industry, polymer and chemistry companies, glass research or similar application fields.


#### Revealing the Invisible: How to Prepare Hidden Targets by Mechanical and Ion Beam Preparation (for SEM)



Preparation of micro targets is not an easy task, as these targets are rarely visible and difficult to handle. 

In this one-hour online workshop our specialists will help reveal the invisible and introduce you to a workflow consisting of a combination of mechanical precision preparation with the Leica EM TXP and ion beam processing with the Leica EM TIC 3X.

Following a short introduction to the topic, you will be able to can follow the sequence of the workflow live online. In the subsequent break-out sessions, you will have the opportunity to get tips and tricks from our specialists on the following sample preparation topics.

**Break Out Session 1** -  Cross sectioning and flat milling:  Ion milling for semi-conductor, aerospace, automotive,  painting and coating or similar application fields.

**Break Out Session 2** - For temperature-sensitive samples: Ion milling for tyres, paper industry, polymer and chemistry companies, glass research or similar application fields.

**Who should attend the online workshop?**

This interactive online workshop is designed for beginners as well as advanced EM users and provides practical tips for sample preparation

**This workshop will ask and answer the following questions:**

* Why is sample preparation so important in electron microscopy?
* What are the special challenges of target preparation? 
* What are the advantages of the synergy between EM TXP and EM TIC 3X?


**Presenter**

![](https://assets.underline.io/uploads/markdown_image/1/image/39ff36d1a4be3a94a3810ae9759dd415.jpg)

Thomas Pfeifer is Advanced Workflow Specialist (AWS) at Leica Microsystems. Before being named AWS in January 2020, Mr. Pfeifer worked for 10 years as Project manager in the R&D department of the Leica´s Nanotechnology division. He holds a scientific degree in Physics from the Technical University of Chemnitz, where he worked as Research assistant at the Chair of Physics of Solid Bodies.
![](https://assets.underline.io/uploads/markdown_image/1/image/eb074685ec698ed223252b9af8e7c05c.jpg)
![](https://assets.underline.io/uploads/markdown_image/1/image/15f1ff4f50d8dd1e6bc765aa49fbd3c1.jpg)
![](https://assets.underline.io/uploads/markdown_image/1/image/eb074685ec698ed223252b9af8e7c05c.jpg)



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